Sub-micron resolution selected area electron channeling patterns
نویسندگان
چکیده
منابع مشابه
Collection of Selected Area Electron Channeling Patterns (SACP) on an FEI Helios NanoLab Scanning Electron Microscope
Electron backscattered diffraction (EBSD) has replaced electron channeling and selected area electron channeling patterns (SACPs) for many scanning electron microscopy (SEM) based crystallographic studies, due to the rapid collection rates and high spatial resolution of EBSD. Nevertheless, a number of SEM techniques, for example electron channeling contrast imaging (ECCI), are better served usi...
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2015
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2014.11.004